7AVV
Crystal structure of SOS1 in complex with compound 9
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2016-08-05 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 1.000 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 38.720, 79.211, 168.156 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 84.080 - 2.120 |
R-factor | 0.2008 |
Rwork | 0.199 |
R-free | 0.24010 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 7avi |
RMSD bond length | 0.008 |
RMSD bond angle | 0.860 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | PHASER |
Refinement software | BUSTER (2.11.7) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 84.090 | 2.240 |
High resolution limit [Å] | 2.120 | 2.120 |
Number of reflections | 25699 | 1286 |
<I/σ(I)> | 9 | |
Completeness [%] | 84.8 | |
Redundancy | 9 | |
CC(1/2) | 0.998 | 0.557 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 277 | 6-11 % PEG 8000, 2 mM DTT, 60 mM Tris |