5XHS
Crystal structure of SIRT5 complexed with a fluorogenic small-molecule substrate SuBKA
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL19U1 |
Synchrotron site | SSRF |
Beamline | BL19U1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2017-02-20 |
Detector | DECTRIS PILATUS 6M |
Wavelength(s) | 1 |
Spacegroup name | P 21 2 21 |
Unit cell lengths | 42.130, 55.274, 124.303 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 39.901 - 2.190 |
R-factor | 0.1759 |
Rwork | 0.173 |
R-free | 0.22430 |
RMSD bond length | 0.012 |
RMSD bond angle | 1.204 |
Data reduction software | HKL-3000 |
Data scaling software | HKL-3000 |
Phasing software | PHASER |
Refinement software | PHENIX ((1.10.1_2155)) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 50.000 |
High resolution limit [Å] | 2.190 |
Number of reflections | 15515 |
<I/σ(I)> | 10 |
Completeness [%] | 99.7 |
Redundancy | 9.4 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 5.5 | 293 | 23% PEG 3350, 0.1 M Bis-Tris pH 5.5, 0.2M NaCl |