5NMV
Crystal structure of 2F22 Fab fragment against TFPI1
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | MAX II BEAMLINE I911-3 |
Synchrotron site | MAX II |
Beamline | I911-3 |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2008-03-26 |
Detector | MARRESEARCH |
Wavelength(s) | 1.0 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 89.010, 66.660, 106.110 |
Unit cell angles | 90.00, 111.18, 90.00 |
Refinement procedure
Resolution | 27.642 - 1.650 |
R-factor | 0.1766 |
Rwork | 0.175 |
R-free | 0.20220 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.010 |
RMSD bond angle | 1.070 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHASER |
Refinement software | PHENIX ((dev_2283: ???)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 27.642 | 1.690 |
High resolution limit [Å] | 1.650 | 1.650 |
Rmerge | 0.084 | 2.280 |
Rmeas | 0.096 | 2.670 |
Number of reflections | 301437 | 19462 |
<I/σ(I)> | 9.56 | 0.67 |
Completeness [%] | 99.5 | 99.2 |
Redundancy | 4.3 | 3.8 |
CC(1/2) | 0.998 | 0.160 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | 20 % PEG 3350 200 mM Potassium formate |