5EYM
MEK1 IN COMPLEX WITH BI 847325
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2011-10-01 |
Detector | PSI PILATUS 6M |
Wavelength(s) | 1.000 |
Spacegroup name | P 61 |
Unit cell lengths | 78.760, 78.760, 223.412 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 68.210 - 2.700 |
R-factor | 0.2468 |
Rwork | 0.243 |
R-free | 0.30770 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 3eqc |
RMSD bond length | 0.006 |
RMSD bond angle | 0.901 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Refinement software | REFMAC (5.5.0088) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 68.210 | 2.890 |
High resolution limit [Å] | 2.700 | 2.700 |
Rmerge | 0.160 | 0.700 |
Number of reflections | 20634 | |
<I/σ(I)> | 5.5 | 1.1 |
Completeness [%] | 97.2 | 97.4 |
Redundancy | 2.6 | 2.6 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 8 | 293 | 18 % PEG 4000, 100 mM Tris, 300 mM NaCl |