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4ZLP

Crystal Structure of Notch3 Negative Regulatory Region

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsAPS BEAMLINE 24-ID-E
Synchrotron siteAPS
Beamline24-ID-E
Temperature [K]100
Detector technologyCCD
Collection date2013-07-17
DetectorADSC QUANTUM 315
Wavelength(s)0.987
Spacegroup nameC 1 2 1
Unit cell lengths122.482, 64.310, 83.089
Unit cell angles90.00, 105.23, 90.00
Refinement procedure
Resolution49.176 - 2.479
R-factor0.1795
Rwork0.178
R-free0.20360
Structure solution methodMOLECULAR REPLACEMENT
RMSD bond length0.008
RMSD bond angle1.051
Data reduction softwareHKL-2000
Data scaling softwareHKL-2000
Phasing softwarePHENIX
Refinement softwarePHENIX (1.9_1692)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]49.1802.570
High resolution limit [Å]2.4792.479
Number of reflections22317
<I/σ(I)>13.272.23
Completeness [%]100.099.87
Redundancy7.57.5
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, SITTING DROP5.429520% isopropanol, 20% PEG4000, and 0.1 M tri-sodium citrate

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