4ZLP
Crystal Structure of Notch3 Negative Regulatory Region
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 24-ID-E |
Synchrotron site | APS |
Beamline | 24-ID-E |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2013-07-17 |
Detector | ADSC QUANTUM 315 |
Wavelength(s) | 0.987 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 122.482, 64.310, 83.089 |
Unit cell angles | 90.00, 105.23, 90.00 |
Refinement procedure
Resolution | 49.176 - 2.479 |
R-factor | 0.1795 |
Rwork | 0.178 |
R-free | 0.20360 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.008 |
RMSD bond angle | 1.051 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | PHENIX |
Refinement software | PHENIX (1.9_1692) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 49.180 | 2.570 |
High resolution limit [Å] | 2.479 | 2.479 |
Number of reflections | 22317 | |
<I/σ(I)> | 13.27 | 2.23 |
Completeness [%] | 100.0 | 99.87 |
Redundancy | 7.5 | 7.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 5.4 | 295 | 20% isopropanol, 20% PEG4000, and 0.1 M tri-sodium citrate |