2W83
Crystal structure of the ARF6 GTPase in complex with a specific effector, JIP4
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SOLEIL BEAMLINE PROXIMA 1 |
Synchrotron site | SOLEIL |
Beamline | PROXIMA 1 |
Temperature [K] | 287 |
Detector technology | IMAGE PLATE |
Collection date | 2008-04-30 |
Detector | MAR555 FLAT PANEL |
Spacegroup name | P 62 2 2 |
Unit cell lengths | 137.270, 137.270, 165.030 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 118.680 - 1.930 |
R-factor | 0.217 |
Rwork | 0.214 |
R-free | 0.23800 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 2j5x |
RMSD bond length | 0.009 |
RMSD bond angle | 1.170 |
Data reduction software | XDS |
Data scaling software | SCALA |
Phasing software | PHASER |
Refinement software | REFMAC (5.2.0019) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 35.000 | 2.030 |
High resolution limit [Å] | 1.930 | 1.930 |
Rmerge | 0.060 | 0.400 |
Number of reflections | 62165 | |
<I/σ(I)> | 8 | 2.1 |
Completeness [%] | 99.9 | 98.2 |
Redundancy | 12.8 | 11.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | 2.0 M AMONIUM SULFATE, 0.1 M HEPES PH 7.5, 0.2 M NACL, 2 MM MGCL2, 6 % MPD |