3K6N
Crystal structure of the S225E mutant Kir3.1 cytoplasmic pore domain
Summary for 3K6N
| Entry DOI | 10.2210/pdb3k6n/pdb |
| Related | 1N9P |
| Descriptor | G protein-activated inward rectifier potassium channel 1, SODIUM ION (3 entities in total) |
| Functional Keywords | beta barrel, cytoplasmic domain, g protein, inward rectifier, potassium channel, metal transport, ion transport, ionic channel, transmembrane |
| Biological source | Mus musculus (mouse) More |
| Cellular location | Membrane; Multi-pass membrane protein: P63250 |
| Total number of polymer chains | 1 |
| Total formula weight | 23730.87 |
| Authors | Xu, Y.,Shin, H.G.,Szep, S.,Lu, Z. (deposition date: 2009-10-09, release date: 2009-11-17, Last modification date: 2023-09-06) |
| Primary citation | Xu, Y.,Shin, H.G.,Szep, S.,Lu, Z. Physical determinants of strong voltage sensitivity of K(+) channel block. Nat.Struct.Mol.Biol., 16:1252-1258, 2009 Cited by PubMed Abstract: Strong voltage sensitivity of inward-rectifier K(+) (Kir) channels has been hypothesized to arise primarily from an intracellular blocker displacing up to five K(+) ions from the wide, intracellular part of the ion conduction pore outwardly across the narrow ion-selectivity filter. The validity of this hypothesis depends on two assumptions: (i) that five ion sites are located intracellular to the filter and (ii) that the blocker can force essentially unidirectional K(+) movement in a pore region generally wider than the combined dimensions of the blocker plus a K(+) ion. Here we present a crystal structure of the cytoplasmic portion of a Kir channel with five ions bound and demonstrate that a constriction near the intracellular end of the pore, acting as a gasket, prevents K(+) ions from bypassing the blocker. This heretofore unrecognized 'gasket' ensures that the blocker can effectively displace K(+) ions across the selectivity filter to generate exceedingly strong voltage sensitivity. PubMed: 19915587DOI: 10.1038/nsmb.1717 PDB entries with the same primary citation |
| Experimental method | X-RAY DIFFRACTION (2 Å) |
Structure validation
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