9GTK
KRAS in complex with DARPin 784_F5
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2016-03-09 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 1.0 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 58.320, 152.830, 149.150 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 47.280 - 2.000 |
| R-factor | 0.17249 |
| Rwork | 0.171 |
| R-free | 0.20063 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.704 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | REFMAC (5.8.0425) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 48.000 | 48.000 | 2.050 |
| High resolution limit [Å] | 2.000 | 8.940 | 2.000 |
| Rmerge | 0.082 | 0.017 | 2.242 |
| Rmeas | 0.088 | 0.018 | 2.413 |
| Number of reflections | 173930 | 1937 | 12866 |
| <I/σ(I)> | 14.28 | ||
| Completeness [%] | 100.0 | ||
| Redundancy | 7.2 | ||
| CC(1/2) | 0.999 | 1.000 | 0.361 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 277.15 | Crystals grew within 25 days in 0.2 M potassium sodium tartrate, 20% w/v PEG 3350 |
