8TXY
X-ray crystal structure of JRD-SIK1/2i-3 bound to a MARK2-SIK2 chimera
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 17-ID |
| Synchrotron site | APS |
| Beamline | 17-ID |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-06-18 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 1.00000 |
| Spacegroup name | P 61 |
| Unit cell lengths | 121.430, 121.430, 99.640 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 46.500 - 2.100 |
| R-factor | 0.2406 |
| Rwork | 0.239 |
| R-free | 0.26650 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.008 |
| RMSD bond angle | 0.910 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.10.4 (8-JUN-2022)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 2.200 |
| High resolution limit [Å] | 2.100 | 2.100 |
| Rmerge | 0.050 | 2.000 |
| Number of reflections | 48682 | 7948 |
| <I/σ(I)> | 23.6 | 1.3 |
| Completeness [%] | 100.0 | 100 |
| Redundancy | 10.2 | 10.2 |
| CC(1/2) | 1.000 | 0.657 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 6.8 | 298 | 24% PEG 400, 150 mM LiSO4, 100 mM MES ph 6.8 |






