8SX4
Crystal Structure of eIF4e in complex with Compound 7n
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 21-ID-D |
Synchrotron site | APS |
Beamline | 21-ID-D |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2022-07-26 |
Detector | DECTRIS EIGER X 9M |
Wavelength(s) | 1.1276 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 49.125, 74.328, 51.877 |
Unit cell angles | 90.00, 97.13, 90.00 |
Refinement procedure
Resolution | 37.810 - 1.986 |
R-factor | 0.1998 |
Rwork | 0.197 |
R-free | 0.24280 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.008 |
RMSD bond angle | 0.870 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | PHASES |
Refinement software | BUSTER (2.10.4 (17-FEB-2023)) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 50.000 | 50.000 | 2.030 |
High resolution limit [Å] | 1.986 | 5.430 | 2.000 |
Rmerge | 0.074 | 0.043 | 0.383 |
Rmeas | 0.083 | 0.046 | 0.436 |
Rpim | 0.035 | 0.018 | 0.204 |
Number of reflections | 24897 | 1315 | 1245 |
<I/σ(I)> | 10.1 | ||
Completeness [%] | 98.0 | 99.8 | 99.2 |
Redundancy | 5.2 | 6.5 | 4.2 |
CC(1/2) | 0.987 | 0.998 | 0.873 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | 16-26% Peg 3350, 0.1 M MES pH 6.0, 10% isopropanol and 2 mM CaCl2 |