7X4U
Crystal structure of ERK2 with an allosteric inhibitor 2
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SPRING-8 BEAMLINE BL44XU |
| Synchrotron site | SPring-8 |
| Beamline | BL44XU |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2020-10-10 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.9 |
| Spacegroup name | P 32 2 1 |
| Unit cell lengths | 91.743, 91.743, 100.308 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 45.870 - 1.980 |
| R-factor | 0.199 |
| Rwork | 0.197 |
| R-free | 0.23490 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 4qte |
| RMSD bond length | 0.009 |
| RMSD bond angle | 0.859 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 45.870 | 2.050 |
| High resolution limit [Å] | 1.980 | 1.980 |
| Rmerge | 0.074 | |
| Number of reflections | 34494 | 3398 |
| <I/σ(I)> | 18.7 | |
| Completeness [%] | 99.8 | 99.8 |
| Redundancy | 10.15 | |
| CC(1/2) | 0.730 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 277 | Bis-Tris, Ammonium Sulfate, PEG 3350 |






