7ZOZ

Crystal structure of Siglec-15 in complex with Fab

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	SLS BEAMLINE X06DA
Synchrotron site	SLS
Beamline	X06DA
Temperature [K]	100
Detector technology	PIXEL
Collection date	2020-09-11
Detector	DECTRIS PILATUS 2M-F
Wavelength(s)	0.97925
Spacegroup name	C 1 2 1
Unit cell lengths	216.534, 60.525, 53.373
Unit cell angles	90.00, 100.82, 90.00

Refinement procedure

Resolution	106.341 - 2.104
R-factor	0.1778
Rwork	0.176
R-free	0.21820
Structure solution method	MOLECULAR REPLACEMENT
Starting model (for MR)	5vkk
Data reduction software	XDS
Data scaling software	XDS
Phasing software	PHASER
Refinement software	PHENIX (1.14_3260)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	106.342	2.180
High resolution limit [Å]	2.104	2.104
Rmerge	0.078	0.633
Rmeas	0.084	0.707
Rpim	0.033	0.307
Number of reflections	37172	1824
<I/σ(I)>	15.1
Completeness [%]	99.8
Redundancy	6.5
CC(1/2)	0.998	0.835

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, HANGING DROP		291	20 % PEG 3350 0.2 M Calcium Chloride