6Q9W
X-ray structure of compound 15 bound to HdmX: Structural states of Hdm2 and HdmX: X-ray elucidation of adaptations and binding interactions for different chemical compound classes
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2012-03-16 |
| Detector | PSI PILATUS 6M |
| Wavelength(s) | 0.99984 |
| Spacegroup name | P 2 2 21 |
| Unit cell lengths | 47.152, 50.334, 92.377 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 19.380 - 1.550 |
| R-factor | 0.2172 |
| Rwork | 0.216 |
| R-free | 0.24040 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 6q9q |
| RMSD bond length | 0.007 |
| RMSD bond angle | 1.165 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | REFMAC |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 19.380 | 1.590 |
| High resolution limit [Å] | 1.550 | 1.550 |
| Rmerge | 0.057 | 0.520 |
| Rmeas | 0.062 | 0.567 |
| Rpim | 0.069 | 0.447 |
| Number of reflections | 32626 | |
| <I/σ(I)> | 18.1 | 3.5 |
| Completeness [%] | 99.8 | 99.9 |
| Redundancy | 6.4 | 6.3 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 7.5 | 298 | 2.25M AmSO4, 4% w/v 18-crown-ether, 0.1M HEPES |
