6B9X
Crystal structure of Ragulator
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 8.3.1 |
| Synchrotron site | ALS |
| Beamline | 8.3.1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2017-08-04 |
| Detector | DECTRIS PILATUS3 S 6M |
| Wavelength(s) | 1.12 |
| Spacegroup name | P 61 |
| Unit cell lengths | 168.705, 168.705, 52.325 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 146.103 |
| High resolution limit [Å] | 1.425 |
| Number of reflections | 271960 |
| <I/σ(I)> | 12.12 |
| Completeness [%] | 93.6 |
| Redundancy | 9.1 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 292 | 0.1 M CHES pH 9.0, 40% PEG 600 |






