5X2F
Crystal structure of EGFR 696-1022 T790M/V948R in complex with SKLB(6)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 24-ID-E |
Synchrotron site | APS |
Beamline | 24-ID-E |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2011-04-06 |
Detector | ADSC QUANTUM 315r |
Wavelength(s) | 0.97924 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 71.499, 102.593, 87.026 |
Unit cell angles | 90.00, 102.64, 90.00 |
Refinement procedure
Resolution | 39.232 - 2.200 |
R-factor | 0.2044 |
Rwork | 0.203 |
R-free | 0.23980 |
RMSD bond length | 0.014 |
RMSD bond angle | 1.325 |
Data reduction software | HKL-3000 |
Data scaling software | HKL-3000 |
Phasing software | PHASER |
Refinement software | PHENIX (1.8.4_1496) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 50.000 |
High resolution limit [Å] | 2.200 |
Number of reflections | 55540 |
<I/σ(I)> | 8.9 |
Completeness [%] | 89.4 |
Redundancy | 3.2 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | 0.1M Bis-Tris 5.0, 22.5% PEG 3350, 5mM TCEP |