5X2A
Crystal structure of EGFR 696-1022 T790M/V948R in complex with SKLB(3)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 24-ID-E |
Synchrotron site | APS |
Beamline | 24-ID-E |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2011-04-06 |
Detector | ADSC QUANTUM 315r |
Wavelength(s) | 0.97924 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 72.185, 103.973, 87.150 |
Unit cell angles | 90.00, 101.40, 90.00 |
Refinement procedure
Resolution | 39.487 - 1.850 |
R-factor | 0.1758 |
Rwork | 0.173 |
R-free | 0.21940 |
RMSD bond length | 0.023 |
RMSD bond angle | 1.890 |
Data reduction software | HKL-3000 |
Data scaling software | HKL-3000 |
Phasing software | PHASER |
Refinement software | PHENIX (1.8.4_1496) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 50.000 |
High resolution limit [Å] | 1.850 |
Number of reflections | 105418 |
<I/σ(I)> | 14.6 |
Completeness [%] | 98.0 |
Redundancy | 3.5 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | 0.1M Bis-Tris 5.0, 22.5% PEG 3350, 5mM TCEP |