5VS6
Structure of DUB complex
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 24-ID-C |
Synchrotron site | APS |
Beamline | 24-ID-C |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2017-02-16 |
Detector | DECTRIS PILATUS 6M-F |
Wavelength(s) | 0.9792 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 75.800, 68.520, 80.310 |
Unit cell angles | 90.00, 96.17, 90.00 |
Refinement procedure
Resolution | 58.005 - 2.270 |
R-factor | 0.1842 |
Rwork | 0.182 |
R-free | 0.23210 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.007 |
RMSD bond angle | 0.856 |
Data reduction software | XDS |
Data scaling software | xia2 |
Phasing software | PHASER |
Refinement software | PHENIX (1.11.1_2575) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 58.010 | 58.020 | 2.310 |
High resolution limit [Å] | 2.270 | 6.160 | 2.270 |
Rmeas | 0.147 | 0.033 | 1.148 |
Rpim | 0.076 | 0.018 | 0.593 |
Total number of observations | 139898 | ||
Number of reflections | 37847 | ||
<I/σ(I)> | 11 | 29.3 | 1.5 |
Completeness [%] | 99.5 | 99.3 | 99.5 |
Redundancy | 3.7 | 3.6 | 3.7 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | PEG 3350, NaFormate |