5IH9

MELK in complex with NVS-MELK8A

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	SLS BEAMLINE X10SA
Synchrotron site	SLS
Beamline	X10SA
Temperature [K]	100
Detector technology	PIXEL
Collection date	2012-05-18
Detector	PSI PILATUS 6M
Wavelength(s)	0.99985
Spacegroup name	P 21 21 21
Unit cell lengths	58.043, 67.697, 104.355
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	26.010 - 1.790
R-factor	0.1738
Rwork	0.172
R-free	0.20020
RMSD bond length	0.010
RMSD bond angle	0.990
Data scaling software	XDS
Refinement software	BUSTER-TNT (2.11.2)

Data quality characteristics

	Overall
Low resolution limit [Å]	67.700
High resolution limit [Å]	1.790
<I/σ(I)>	16.6
Completeness [%]	100.0
Redundancy	6.6

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, SITTING DROP		277	100mM Hepes, pH 7.6, 0.2M NaCl, 4.5-16.5% PEG3350