5D7O
Crystal structure of Sirt2-ADPR at an improved resolution
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2013-07-19 |
Detector | DECTRIS PILATUS 6M |
Wavelength(s) | 1 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 78.000, 78.170, 114.241 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 49.710 - 1.630 |
R-factor | 0.17192 |
Rwork | 0.171 |
R-free | 0.19070 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 3zgv |
RMSD bond length | 0.005 |
RMSD bond angle | 1.149 |
Data reduction software | MOSFLM |
Data scaling software | Aimless |
Phasing software | MOLREP |
Refinement software | REFMAC (5.8.0071) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 49.710 | 1.660 |
High resolution limit [Å] | 1.630 | 1.630 |
Rmerge | 0.114 | 0.983 |
Number of reflections | 87718 | |
<I/σ(I)> | 8 | |
Completeness [%] | 100.0 | |
Redundancy | 6.1 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 6.25 | 277 | 0.2 M sodium chloride, 30 % (w/v) PEG 3350, 0.1 M Bis-Tris |