5ZXF
The 1.25A Crystal structure of His6-tagged Mdm2 in complex with nutlin-3a
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL17U1 |
| Synchrotron site | SSRF |
| Beamline | BL17U1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2018-04-13 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.979 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 42.575, 43.222, 53.853 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 33.420 - 1.250 |
| R-factor | 0.2191 |
| Rwork | 0.218 |
| R-free | 0.24310 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.016 |
| RMSD bond angle | 1.806 |
| Data reduction software | HKL-2000 |
| Data scaling software | Aimless (0.6.2) |
| Phasing software | MOLREP |
| Refinement software | REFMAC (5.8.0230) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 33.420 | 1.320 |
| High resolution limit [Å] | 1.250 | 1.250 |
| Rmerge | 0.073 | 0.648 |
| Rmeas | 0.077 | 0.702 |
| Rpim | 0.023 | 0.261 |
| Number of reflections | 27731 | 3735 |
| <I/σ(I)> | 20.2 | |
| Completeness [%] | 98.8 | 93 |
| Redundancy | 11.7 | 6.8 |
| CC(1/2) | 0.996 | 0.848 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 291 | 0.2M NaOAc, 1.2M AmSO4, Seeding. |






