5VAM
BRAF in Complex with RAF709
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 17-ID |
| Synchrotron site | APS |
| Beamline | 17-ID |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2013-04-14 |
| Detector | DECTRIS PILATUS3 6M |
| Wavelength(s) | 1.0 |
| Spacegroup name | P 41 21 2 |
| Unit cell lengths | 109.390, 109.390, 135.980 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 30.750 - 2.100 |
| R-factor | 0.194 |
| Rwork | 0.192 |
| R-free | 0.22300 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.030 |
| Data reduction software | XDS |
| Data scaling software | Aimless |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.11.6) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 48.920 | 48.920 | 2.160 |
| High resolution limit [Å] | 2.100 | 8.910 | 2.100 |
| Rmerge | 0.200 | 0.028 | 1.710 |
| Rmeas | 0.216 | 0.030 | 1.871 |
| Rpim | 0.081 | 0.012 | 0.754 |
| Total number of observations | 322160 | 4688 | 23899 |
| Number of reflections | 45681 | ||
| <I/σ(I)> | 10.1 | 45.8 | 1.1 |
| Completeness [%] | 93.6 | 99.5 | 100 |
| Redundancy | 7.1 | 6.2 | 6.1 |
| CC(1/2) | 0.995 | 1.000 | 0.402 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 8.4 | 291 | 100 mM Tris ph 8.4, 12% PEG8000, and 50mM NaCl |
