4XR8
Crystal structure of the HPV16 E6/E6AP/p53 ternary complex at 2.25 A resolution
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06DA |
| Synchrotron site | SLS |
| Beamline | X06DA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2013-10-10 |
| Detector | DECTRIS PILATUS 2M |
| Wavelength(s) | 1.0 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 77.842, 128.939, 81.560 |
| Unit cell angles | 90.00, 92.33, 90.00 |
Refinement procedure
| Resolution | 49.635 - 2.250 |
| R-factor | 0.1962 |
| Rwork | 0.194 |
| R-free | 0.24630 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 4giz 1tup |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.348 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHASER |
| Refinement software | PHENIX ((phenix.refine: 1.8.4_1496)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 2.330 |
| High resolution limit [Å] | 2.250 | 2.250 |
| Rmerge | 0.060 | 0.684 |
| Number of reflections | 77282 | |
| <I/σ(I)> | 10.52 | 1.99 |
| Completeness [%] | 98.6 | 89.64 |
| Redundancy | 3.2 | 3.1 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 290 | 7.5 % PEG 20K, 0.05 M MES pH 6.5 |
