4XL1
Complex of Notch1 (EGF11-13) bound to Delta-like 4 (N-EGF1)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 23-ID-D |
| Synchrotron site | APS |
| Beamline | 23-ID-D |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2014-06-21 |
| Detector | PSI PILATUS 6M |
| Wavelength(s) | 1.0331 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 77.809, 93.700, 99.126 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 49.560 - 2.300 |
| R-factor | 0.22 |
| Rwork | 0.218 |
| R-free | 0.25900 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.021 |
| RMSD bond angle | 1.354 |
| Data reduction software | XDS (20140110) |
| Data scaling software | XDS (20140110) |
| Phasing software | PHASER (2.5.6) |
| Refinement software | PHENIX (DEV-1839) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 2.420 |
| High resolution limit [Å] | 2.290 | 2.290 |
| Rmerge | 0.106 | 0.846 |
| Number of reflections | 32367 | |
| <I/σ(I)> | 12.15 | 1.78 |
| Completeness [%] | 99.2 | 95.4 |
| Redundancy | 6.34 | 7.82 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7.4 | 293 | 20% PEG 4000, 2.5% isopropanol, 1% n-dodecyl beta-D-maltoside |
