3Q4F

Crystal structure of xrcc4/xlf-cernunnos complex

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	SOLEIL BEAMLINE PROXIMA 1
Synchrotron site	SOLEIL
Beamline	PROXIMA 1
Temperature [K]	200
Wavelength(s)	1.044
Spacegroup name	P 65 2 2
Unit cell lengths	103.860, 103.860, 855.220
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	48.790 - 5.500
R-factor	0.2523
Rwork	0.249
R-free	0.30930
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.009
RMSD bond angle	1.100
Data scaling software	XSCALE
Phasing software	MOLREP
Refinement software	BUSTER-TNT

Data quality characteristics

	Overall
Low resolution limit [Å]	58.900
High resolution limit [Å]	5.500
Rmerge	0.162
Number of reflections	9895
<I/σ(I)>	13.3
Completeness [%]	85.4
Redundancy	20.4

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, SITTING DROP	6.5	293	9% v/v MPD, 50 mM MgSO4, 0.1 M Na Cacodylate, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K