2XW9
Crystal Structure of Complement Factor D mutant S183A
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2009-11-30 |
Detector | DECTRIS PILATUS 6M |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 39.510, 49.550, 55.480 |
Unit cell angles | 90.00, 105.64, 90.00 |
Refinement procedure
Resolution | 53.430 - 1.200 |
R-factor | 0.14528 |
Rwork | 0.144 |
R-free | 0.17605 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 1dsu |
RMSD bond length | 0.010 |
RMSD bond angle | 1.456 |
Data reduction software | iMOSFLM |
Data scaling software | SCALA |
Phasing software | PHASER |
Refinement software | REFMAC (5.5.0102) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 35.900 | 1.260 |
High resolution limit [Å] | 1.200 | 1.200 |
Rmerge | 0.070 | 0.250 |
Number of reflections | 64058 | |
<I/σ(I)> | 8 | 3.5 |
Completeness [%] | 99.3 | 98.8 |
Redundancy | 2.9 | 2.7 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | 6 | pH 6.0 |