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2HEV

Crystal structure of the complex between OX40L and OX40

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsALS BEAMLINE 5.0.2
Synchrotron siteALS
Beamline5.0.2
Temperature [K]100
Detector technologyCCD
Collection date2003-10-26
DetectorADSC QUANTUM 210
Wavelength(s)0.9999
Spacegroup nameH 3 2
Unit cell lengths111.903, 111.903, 233.238
Unit cell angles90.00, 90.00, 120.00
Refinement procedure
Resolution30.000 - 2.410
R-factor0.21248
Rwork0.208
R-free0.25110
Structure solution methodMOLECULAR REPLACEMENT
RMSD bond length0.007
RMSD bond angle1.109
Phasing softwareAMoRE
Refinement softwareREFMAC (5.2.0005)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]50.0002.490
High resolution limit [Å]2.4002.400
Number of reflections22255
<I/σ(I)>11.82.3
Completeness [%]99.9100
Redundancy6.16.1
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, HANGING DROP6.52938% PEG 20000, 0.1M MES, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

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