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2H2H

The Structural basis of sirtuin substrate specificity

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsAPS BEAMLINE 14-BM-D
Synchrotron siteAPS
Beamline14-BM-D
Temperature [K]100
Detector technologyCCD
Collection date2004-12-05
Wavelength(s)1.0
Spacegroup nameP 21 21 21
Unit cell lengths45.810, 59.265, 106.238
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution7.980 - 2.200
R-factor0.2
Rwork0.200
R-free0.23900
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR): 2H2I
RMSD bond length0.005
RMSD bond angle1.100
Data reduction softwareHKL-2000
Data scaling softwareSCALEPACK
Phasing softwareCNS
Refinement softwareCNS
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]50.0002.050
High resolution limit [Å]2.0001.980
Rmerge0.0710.401
Number of reflections20553
<I/σ(I)>28.15.3
Completeness [%]98.497.7
Redundancy4.57.5
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, HANGING DROP9.5293.1520 % PEG, VAPOR DIFFUSION, HANGING DROP, temperature 293.15K, pH 9.5

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