ソフトウェア | 名称 | バージョン | 分類 |
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PHENIX | 1.9_1692精密化 | XDS | | データ削減 | XSCALE | | データスケーリング | PHASER | | 位相決定 | |
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精密化 | 構造決定の手法: 分子置換 開始モデル: 4H8W 解像度: 1.503→32.19 Å / SU ML: 0.19 / 交差検証法: NONE / σ(F): 1.35 / 位相誤差: 22.07
| Rfactor | 反射数 | %反射 |
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Rfree | 0.2115 | 3669 | 5 % |
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Rwork | 0.1788 | - | - |
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obs | 0.1805 | 73375 | 98.99 % |
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溶媒の処理 | 減衰半径: 0.9 Å / VDWプローブ半径: 1.11 Å |
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精密化ステップ | サイクル: LAST / 解像度: 1.503→32.19 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 3130 | 0 | 0 | 701 | 3831 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | 数 |
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X-RAY DIFFRACTION | f_bond_d0.01 | 3241 | X-RAY DIFFRACTION | f_angle_d1.272 | 4427 | X-RAY DIFFRACTION | f_dihedral_angle_d12.579 | 1144 | X-RAY DIFFRACTION | f_chiral_restr0.057 | 506 | X-RAY DIFFRACTION | f_plane_restr0.007 | 566 | | | | | |
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LS精密化 シェル | 解像度 (Å) | Rfactor Rfree | Num. reflection Rfree | Rfactor Rwork | Num. reflection Rwork | Refine-ID | % reflection obs (%) |
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1.5031-1.5229 | 0.3419 | 130 | 0.3339 | 2455 | X-RAY DIFFRACTION | 92 | 1.5229-1.5438 | 0.3537 | 139 | 0.2935 | 2641 | X-RAY DIFFRACTION | 100 | 1.5438-1.5658 | 0.2897 | 140 | 0.2818 | 2674 | X-RAY DIFFRACTION | 99 | 1.5658-1.5892 | 0.2851 | 141 | 0.2688 | 2678 | X-RAY DIFFRACTION | 100 | 1.5892-1.614 | 0.2779 | 141 | 0.2556 | 2662 | X-RAY DIFFRACTION | 100 | 1.614-1.6405 | 0.2995 | 139 | 0.2423 | 2648 | X-RAY DIFFRACTION | 100 | 1.6405-1.6688 | 0.2812 | 141 | 0.234 | 2675 | X-RAY DIFFRACTION | 100 | 1.6688-1.6991 | 0.2619 | 141 | 0.221 | 2690 | X-RAY DIFFRACTION | 100 | 1.6991-1.7318 | 0.2812 | 141 | 0.2126 | 2664 | X-RAY DIFFRACTION | 100 | 1.7318-1.7671 | 0.2222 | 142 | 0.2079 | 2700 | X-RAY DIFFRACTION | 100 | 1.7671-1.8055 | 0.2303 | 139 | 0.1967 | 2648 | X-RAY DIFFRACTION | 100 | 1.8055-1.8475 | 0.263 | 142 | 0.1959 | 2690 | X-RAY DIFFRACTION | 100 | 1.8475-1.8937 | 0.2265 | 141 | 0.1853 | 2696 | X-RAY DIFFRACTION | 100 | 1.8937-1.9449 | 0.1905 | 141 | 0.1786 | 2676 | X-RAY DIFFRACTION | 100 | 1.9449-2.0022 | 0.2218 | 141 | 0.1817 | 2683 | X-RAY DIFFRACTION | 100 | 2.0022-2.0668 | 0.2224 | 141 | 0.1691 | 2679 | X-RAY DIFFRACTION | 100 | 2.0668-2.1406 | 0.2073 | 141 | 0.1727 | 2661 | X-RAY DIFFRACTION | 100 | 2.1406-2.2263 | 0.22 | 142 | 0.1748 | 2702 | X-RAY DIFFRACTION | 99 | 2.2263-2.3276 | 0.2153 | 142 | 0.1809 | 2697 | X-RAY DIFFRACTION | 99 | 2.3276-2.4503 | 0.2537 | 142 | 0.1782 | 2708 | X-RAY DIFFRACTION | 100 | 2.4503-2.6037 | 0.2423 | 142 | 0.1858 | 2695 | X-RAY DIFFRACTION | 99 | 2.6037-2.8047 | 0.1976 | 143 | 0.1803 | 2714 | X-RAY DIFFRACTION | 99 | 2.8047-3.0867 | 0.2182 | 142 | 0.1737 | 2698 | X-RAY DIFFRACTION | 99 | 3.0867-3.5329 | 0.1869 | 144 | 0.1612 | 2733 | X-RAY DIFFRACTION | 99 | 3.5329-4.4492 | 0.1601 | 145 | 0.1439 | 2751 | X-RAY DIFFRACTION | 98 | 4.4492-32.1974 | 0.168 | 146 | 0.1529 | 2788 | X-RAY DIFFRACTION | 96 |
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精密化 TLS | 手法: refined / Origin x: 17.0932 Å / Origin y: -17.7426 Å / Origin z: 5.101 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
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T | 0.1235 Å2 | 0.0041 Å2 | 0.0076 Å2 | - | 0.1607 Å2 | 0.0033 Å2 | - | - | 0.1389 Å2 |
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L | 0.2623 °2 | 0.1026 °2 | 0.1285 °2 | - | 0.6177 °2 | -0.06 °2 | - | - | 0.3595 °2 |
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S | -0.027 Å ° | -0.0089 Å ° | 0.0231 Å ° | -0.037 Å ° | 0.0132 Å ° | 0.0161 Å ° | -0.044 Å ° | -0.0404 Å ° | 0.0122 Å ° |
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精密化 TLSグループ | Selection details: all |
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