ジャーナル: J Appl Crystallogr / 年: 2016 タイトル: Modeling truncated pixel values of faint reflections in MicroED images. 著者: Johan Hattne / Dan Shi / M Jason de la Cruz / Francis E Reyes / Tamir Gonen / 要旨: The weak pixel counts surrounding the Bragg spots in a diffraction image are important for establishing a model of the background underneath the peak and estimating the reliability of the integrated ...The weak pixel counts surrounding the Bragg spots in a diffraction image are important for establishing a model of the background underneath the peak and estimating the reliability of the integrated intensities. Under certain circumstances, particularly with equipment not optimized for low-intensity measurements, these pixel values may be corrupted by corrections applied to the raw image. This can lead to truncation of low pixel counts, resulting in anomalies in the integrated Bragg intensities, such as systematically higher signal-to-noise ratios. A correction for this effect can be approximated by a three-parameter lognormal distribution fitted to the weakly positive-valued pixels at similar scattering angles. The procedure is validated by the improved refinement of an atomic model against structure factor amplitudes derived from corrected micro-electron diffraction (MicroED) images.
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2016年2月20日
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2016年6月8日
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2016年6月22日
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2016年11月23日
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2016年11月30日
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2018年7月18日
Group: Data collection / Other / カテゴリ: pdbx_database_status / Item: _pdbx_database_status.status_code_sf