1ORS
X-ray structure of the KvAP potassium channel voltage sensor in complex with an Fab
Summary for 1ORS
Entry DOI | 10.2210/pdb1ors/pdb |
Related | 1ORQ |
Descriptor | 33H1 Fab light chain, 33H1 Fab heavy chain, potassium channel, ... (4 entities in total) |
Functional Keywords | potassium channel, voltage-dependent, voltage sensor, kvap, fab complex, membrane protein |
Biological source | Aeropyrum pernix More |
Cellular location | Cell membrane; Single-pass membrane protein (Potential): P01869 Cell membrane; Multi-pass membrane protein: Q9YDF8 |
Total number of polymer chains | 3 |
Total formula weight | 62083.06 |
Authors | Jiang, Y.,Lee, A.,Chen, J.,Ruta, V.,Cadene, M.,Chait, B.T.,MacKinnon, R. (deposition date: 2003-03-14, release date: 2003-05-06, Last modification date: 2024-10-30) |
Primary citation | Jiang, Y.,Lee, A.,Chen, J.,Ruta, V.,Cadene, M.,Chait, B.T.,MacKinnon, R. X-ray structure of a voltage-dependent K+ channel Nature, 423:33-41, 2003 Cited by PubMed Abstract: Voltage-dependent K+ channels are members of the family of voltage-dependent cation (K+, Na+ and Ca2+) channels that open and allow ion conduction in response to changes in cell membrane voltage. This form of gating underlies the generation of nerve and muscle action potentials, among other processes. Here we present the structure of KvAP, a voltage-dependent K+ channel from Aeropyrum pernix. We have determined a crystal structure of the full-length channel at a resolution of 3.2 A, and of the isolated voltage-sensor domain at 1.9 A, both in complex with monoclonal Fab fragments. The channel contains a central ion-conduction pore surrounded by voltage sensors, which form what we call 'voltage-sensor paddles'-hydrophobic, cationic, helix-turn-helix structures on the channel's outer perimeter. Flexible hinges suggest that the voltage-sensor paddles move in response to membrane voltage changes, carrying their positive charge across the membrane. PubMed: 12721618DOI: 10.1038/nature01580 PDB entries with the same primary citation |
Experimental method | X-RAY DIFFRACTION (1.9 Å) |
Structure validation
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