9NVA
Crystal structure of NP105 TCR in complex with NP366-H-2Db
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS-II BEAMLINE 19-ID |
| Synchrotron site | NSLS-II |
| Beamline | 19-ID |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2024-04-02 |
| Detector | DECTRIS EIGER2 XE 9M |
| Wavelength(s) | 0.9786 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 58.171, 131.704, 141.937 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 49.830 - 2.780 |
| R-factor | 0.2171 |
| Rwork | 0.215 |
| R-free | 0.26300 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.002 |
| RMSD bond angle | 0.474 |
| Data reduction software | HKL-3000 |
| Data scaling software | HKL-3000 |
| Phasing software | HKL-3000 |
| Refinement software | PHENIX (1.21.2_5419) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 2.870 |
| High resolution limit [Å] | 2.780 | 2.780 |
| Rmerge | 0.160 | 0.980 |
| Rmeas | 0.175 | 1.070 |
| Rpim | 0.070 | 0.418 |
| Number of reflections | 26780 | 1758 |
| <I/σ(I)> | 8 | 1 |
| Completeness [%] | 95.8 | 97.9 |
| Redundancy | 5.6 | 5.7 |
| CC(1/2) | 0.985 | 0.628 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 289 | 0.1 M Sodium citrate, 5% (v/v) 2-Propanol, 20% (w/v) PEG 4,000 |
