EM specimen
| Vitrification | Yes |
| Instrument | LEICA EM GP |
EM Data Collection
| Microscope | TFS KRIOS |
| Electron Gun | FIELD EMISSION GUN |
| Accelerating Voltage (kV) | 300 |
| Cs (mm) | 2.7 |
| Energy Filter | TFS Selectris |
| Detector | TFS FALCON 4i (4k x 4k) |
3D Reconstruction
| Method | SINGLE PARTICLE |
| Resolution (Å) | 2.9 |
| Number of Particle | 9955887 |
| Software | Topaz,Rosetta,cryoSPARC,PHENIX,EPU,ISOLDE,Coot,UCSF ChimeraX |
| CTF correction | PHASE FLIPPING AND AMPLITUDE CORRECTION |
