9DJW
X-ray crystal structure of TNFa-VNAR D1 complex
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) |
| Synchrotron site | PETRA III, EMBL c/o DESY |
| Beamline | P14 (MX2) |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2018-10-22 |
| Detector | DECTRIS EIGER2 S 16M |
| Wavelength(s) | 0.984 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 112.320, 218.127, 236.485 |
| Unit cell angles | 90.00, 96.28, 90.00 |
Refinement procedure
| Resolution | 109.060 - 3.430 |
| R-factor | 0.2332 |
| Rwork | 0.230 |
| R-free | 0.28850 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.004 |
| RMSD bond angle | 0.922 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | PHENIX ((1.21.2_5419: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 109.302 | 3.510 |
| High resolution limit [Å] | 3.310 | 3.310 |
| Rmerge | 0.579 | 2.725 |
| Number of reflections | 155984 | 1043 |
| <I/σ(I)> | 3.23 | |
| Completeness [%] | 92.8 | |
| Redundancy | 3.5 | 1.9 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 291 | 19 % PEG 8000, 0.2 M ammonium sulphate and 0.1 M MES pH 6.0 |






