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9DJW

X-ray crystal structure of TNFa-VNAR D1 complex

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsPETRA III, EMBL c/o DESY BEAMLINE P14 (MX2)
Synchrotron sitePETRA III, EMBL c/o DESY
BeamlineP14 (MX2)
Temperature [K]100
Detector technologyPIXEL
Collection date2018-10-22
DetectorDECTRIS EIGER2 S 16M
Wavelength(s)0.984
Spacegroup nameP 1 21 1
Unit cell lengths112.320, 218.127, 236.485
Unit cell angles90.00, 96.28, 90.00
Refinement procedure
Resolution109.060 - 3.430
R-factor0.2332
Rwork0.230
R-free0.28850
Structure solution methodMOLECULAR REPLACEMENT
RMSD bond length0.004
RMSD bond angle0.922
Data reduction softwareXDS
Data scaling softwareXSCALE
Phasing softwarePHASER
Refinement softwarePHENIX ((1.21.2_5419: ???))
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]109.3023.510
High resolution limit [Å]3.3103.310
Rmerge0.5792.725
Number of reflections1559841043
<I/σ(I)>3.23
Completeness [%]92.8
Redundancy3.51.9
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, HANGING DROP29119 % PEG 8000, 0.2 M ammonium sulphate and 0.1 M MES pH 6.0

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