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8XR4

Crystal structure of AKRtyl-NADP(H) complex

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsSSRF BEAMLINE BL18U1
Synchrotron siteSSRF
BeamlineBL18U1
Temperature [K]100
Detector technologyPIXEL
Collection date2023-12-03
DetectorDECTRIS PILATUS3 6M
Wavelength(s)0.97862
Spacegroup nameP 2 21 21
Unit cell lengths82.875, 197.643, 199.984
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution45.980 - 1.940
R-factor0.1722
Rwork0.171
R-free0.19960
Structure solution methodMOLECULAR REPLACEMENT
RMSD bond length0.008
RMSD bond angle1.001
Data reduction softwareHKL-3000 (7.21)
Data scaling softwareHKL-3000 (7.21)
Phasing softwarePHASER (2.7.0)
Refinement softwarePHENIX (1.17.1_3660)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]45.9801.970
High resolution limit [Å]1.9401.940
Number of reflections24243711892
<I/σ(I)>9.62.1
Completeness [%]100.0
Redundancy12.1
CC(1/2)0.9960.820
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, SITTING DROP293.1518% PEG3350, 0.1 M Sodium citrate, pH 5.5

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