8XR4
Crystal structure of AKRtyl-NADP(H) complex
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL18U1 |
Synchrotron site | SSRF |
Beamline | BL18U1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2023-12-03 |
Detector | DECTRIS PILATUS3 6M |
Wavelength(s) | 0.97862 |
Spacegroup name | P 2 21 21 |
Unit cell lengths | 82.875, 197.643, 199.984 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 45.980 - 1.940 |
R-factor | 0.1722 |
Rwork | 0.171 |
R-free | 0.19960 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.008 |
RMSD bond angle | 1.001 |
Data reduction software | HKL-3000 (7.21) |
Data scaling software | HKL-3000 (7.21) |
Phasing software | PHASER (2.7.0) |
Refinement software | PHENIX (1.17.1_3660) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 45.980 | 1.970 |
High resolution limit [Å] | 1.940 | 1.940 |
Number of reflections | 242437 | 11892 |
<I/σ(I)> | 9.6 | 2.1 |
Completeness [%] | 100.0 | |
Redundancy | 12.1 | |
CC(1/2) | 0.996 | 0.820 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293.15 | 18% PEG3350, 0.1 M Sodium citrate, pH 5.5 |