8Q6R
Structure of complement FP in complex with the TPP-3077 VHH
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) |
| Synchrotron site | PETRA III, EMBL c/o DESY |
| Beamline | P14 (MX2) |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-06-27 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.9763 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 79.210, 63.701, 119.249 |
| Unit cell angles | 90.00, 103.75, 90.00 |
Refinement procedure
| Resolution | 47.860 - 1.900 |
| R-factor | 0.2031 |
| Rwork | 0.202 |
| R-free | 0.23800 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.017 |
| RMSD bond angle | 1.701 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 47.860 | 1.968 |
| High resolution limit [Å] | 1.900 | 1.900 |
| Rmerge | 0.113 | 1.137 |
| Number of reflections | 89619 | 8051 |
| <I/σ(I)> | 9.05 | |
| Completeness [%] | 98.1 | 88.69 |
| Redundancy | 6.8 | 5.6 |
| CC(1/2) | 0.998 | 0.751 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 292 | 95% Morpheus Screen III, condition G1 |
