8J54
Crystal structure of RXR/DR2 complex
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL02U1 |
Synchrotron site | SSRF |
Beamline | BL02U1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2021-04-23 |
Detector | DECTRIS EIGER2 S 9M |
Wavelength(s) | 0.979 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 36.239, 63.646, 244.649 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 38.790 - 2.720 |
R-factor | 0.2225 |
Rwork | 0.217 |
R-free | 0.27290 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.003 |
RMSD bond angle | 0.496 |
Data reduction software | HKL-2000 |
Data scaling software | autoPROC |
Phasing software | PHASER |
Refinement software | PHENIX ((1.19.2_4158: ???)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 38.790 | 2.820 |
High resolution limit [Å] | 2.700 | 2.700 |
Number of reflections | 28366 | 1554 |
<I/σ(I)> | 16.5 | |
Completeness [%] | 96.8 | |
Redundancy | 12.3 | |
CC(1/2) | 0.998 | 0.978 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 278 | 0.1 M Bis-Tris6.5, 0.01 mM CaCl2, 18-23% PEG2000MME |