8GAB
Crystal structure of CTLA-4 in complex with a high affinity CTLA-4 binder
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS-II BEAMLINE 17-ID-2 |
| Synchrotron site | NSLS-II |
| Beamline | 17-ID-2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-02-01 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.98 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 175.749, 33.604, 74.474 |
| Unit cell angles | 90.00, 101.15, 90.00 |
Refinement procedure
| Resolution | 24.950 - 2.720 |
| R-factor | 0.2496 |
| Rwork | 0.247 |
| R-free | 0.29200 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.006 |
| RMSD bond angle | 1.327 |
| Data reduction software | autoPROC |
| Data scaling software | Aimless |
| Phasing software | PHASER (2.8.3) |
| Refinement software | PHENIX (1.20.1_4487) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 25.000 | 2.820 |
| High resolution limit [Å] | 2.720 | 2.720 |
| Rmerge | 0.087 | 0.890 |
| Number of reflections | 11876 | 1237 |
| <I/σ(I)> | 10.35 | 2.08 |
| Completeness [%] | 99.8 | |
| Redundancy | 3.7 | |
| CC(1/2) | 0.990 | 0.870 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7 | 292 | 22% (w/v) PEG 3350 and 0.2 M KCl |






