8CK3
STRUCTURE OF HIF2A-ARNT HETERODIMER IN COMPLEX WITH (S)-1-(3,5-Difluoro-phenyl)-5,5-difluoro-3-methanesulfonyl-5,6-dihydro-4H-cyclopenta[c]thiophen-4-ol
Experimental procedure
| Experimental method | SINGLE WAVELENGTH | 
| Source type | SYNCHROTRON | 
| Source details | SLS BEAMLINE X10SA | 
| Synchrotron site | SLS | 
| Beamline | X10SA | 
| Temperature [K] | 100 | 
| Detector technology | PIXEL | 
| Collection date | 2017-12-15 | 
| Detector | DECTRIS PILATUS3 6M | 
| Wavelength(s) | 0.99996 | 
| Spacegroup name | C 1 2 1 | 
| Unit cell lengths | 72.671, 83.594, 40.935 | 
| Unit cell angles | 90.00, 106.86, 90.00 | 
Refinement procedure
| Resolution | 53.470 - 1.707 | 
| R-factor | 0.199 | 
| Rwork | 0.197 | 
| R-free | 0.22700 | 
| Structure solution method | MOLECULAR REPLACEMENT | 
| RMSD bond length | 0.009 | 
| RMSD bond angle | 1.060 | 
| Data reduction software | XDS | 
| Data scaling software | XDS | 
| Phasing software | PHASER | 
| Refinement software | BUSTER (2.11.8 (8-JUN-2022)) | 
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 53.470 | 1.905 | 
| High resolution limit [Å] | 1.707 | 1.707 | 
| Rmeas | 0.072 | |
| Rpim | 0.050 | 0.579 | 
| Number of reflections | 15973 | 799 | 
| <I/σ(I)> | 11.8 | |
| Completeness [%] | 62.7 | |
| Redundancy | 3.4 | |
| CC(1/2) | 0.999 | 0.512 | 
Crystallization Conditions
| crystal ID | method | pH | temperature | details | 
| 1 | VAPOR DIFFUSION, HANGING DROP | 293 | 22% PEG 3350, 0.1 M BIS TRIS pH 6.0 | 






