8AJO
Negative-stain electron microscopy structure of DDB1-DCAF12-CCT5
EM specimen
Staining | Yes |
Staining material | Uranyl acetate |
EM Data Collection
Microscope | FEI TECNAI SPIRIT |
Electron Gun | FIELD EMISSION GUN |
Accelerating Voltage (kV) | 120 |
Detector | FEI EAGLE (4k x 4k) |
3D Reconstruction
Method | SINGLE PARTICLE |
Resolution (Å) | 30.6 |
CTF correction | PHASE FLIPPING AND AMPLITUDE CORRECTION |