8CK8
STRUCTURE OF HIF2A-ARNT HETERODIMER IN COMPLEX WITH (S)-1-Cyclohexyloxy-5,5-difluoro-3-methanesulfonyl-5,6-dihydro-4H-cyclopenta[c]thiophen-4-ol
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2018-03-21 |
| Detector | DECTRIS PILATUS 6M-F |
| Wavelength(s) | 0.99999 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 72.353, 83.731, 41.170 |
| Unit cell angles | 90.00, 106.70, 90.00 |
Refinement procedure
| Resolution | 35.720 - 2.302 |
| R-factor | 0.205 |
| Rwork | 0.201 |
| R-free | 0.27600 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.950 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | BUSTER |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 35.720 | 2.384 |
| High resolution limit [Å] | 2.302 | 2.302 |
| Rmeas | 0.106 | 0.559 |
| Rpim | 0.083 | 0.411 |
| Number of reflections | 8380 | 419 |
| <I/σ(I)> | 7.8 | |
| Completeness [%] | 80.1 | |
| Redundancy | 2.7 | |
| CC(1/2) | 0.977 | 0.766 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 17% (w/v) PEG3350 ; 0.1 M BisTris pH 6.25 |






