7XT2
Crystal structure of TRIM72
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL19U1 |
Synchrotron site | SSRF |
Beamline | BL19U1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2021-06-08 |
Detector | DECTRIS PILATUS 6M |
Wavelength(s) | 0.97915 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 72.571, 125.231, 174.537 |
Unit cell angles | 90.00, 91.45, 90.00 |
Refinement procedure
Resolution | 43.140 - 3.000 |
R-factor | 0.2206 |
Rwork | 0.219 |
R-free | 0.25470 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 3kb5 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | PHASER |
Refinement software | PHENIX (1.20rc1_4392) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 43.140 | 3.107 |
High resolution limit [Å] | 3.000 | 3.000 |
Rmerge | 0.097 | |
Rpim | 0.040 | |
Number of reflections | 60046 | 3064 |
<I/σ(I)> | 13.14 | |
Completeness [%] | 98.6 | 99 |
Redundancy | 6.9 | |
CC(1/2) | 0.999 | 0.510 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 289 | PEG8000 |