Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | DIAMOND BEAMLINE I04 |
Synchrotron site | Diamond |
Beamline | I04 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2020-12-02 |
Detector | DECTRIS EIGER2 XE 16M |
Wavelength(s) | 0.9795 |
Spacegroup name | P 43 21 2 |
Unit cell lengths | 89.391, 89.391, 293.298 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 85.354 | 2.590 |
High resolution limit [Å] | 2.550 | 2.550 |
Rmerge | 0.207 | 6.926 |
Rpim | 0.041 | 1.343 |
Number of reflections | 39941 | 1932 |
<I/σ(I)> | 11.6 | 0.3 |
Completeness [%] | 100.0 | |
Redundancy | 26.3 | |
CC(1/2) | 1.000 | 0.735 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | 23.2% (w/v) PEG 1500, 93 mM MMT pH 9.0 |