EM specimen
| Vitrification | Yes |
EM Data Collection
| Microscope | JEOL 3200FSC,FEI TECNAI F20 |
| Electron Gun | FIELD EMISSION GUN |
| Accelerating Voltage (kV) | 300,200 |
| Detector | GATAN K2 SUMMIT (4k x 4k) |
3D Reconstruction
| Method | SINGLE PARTICLE |
| Resolution (Å) | 4.6 |
| CTF correction | PHASE FLIPPING AND AMPLITUDE CORRECTION |
