7F4Z
X-ray crystal structure of Y149A mutated Hsp72-NBD in complex with ADP
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | PHOTON FACTORY BEAMLINE BL-17A |
| Synchrotron site | Photon Factory |
| Beamline | BL-17A |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-11-10 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.98 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 45.850, 63.599, 144.142 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 29.411 - 1.800 |
| R-factor | 0.1796 |
| Rwork | 0.178 |
| R-free | 0.21560 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 5aqz |
| RMSD bond length | 0.006 |
| RMSD bond angle | 0.839 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHENIX |
| Refinement software | PHENIX ((1.12_2829: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 47.690 | 1.860 |
| High resolution limit [Å] | 1.800 | 1.800 |
| Rmeas | 0.076 | 0.701 |
| Rpim | 0.032 | 0.287 |
| Number of reflections | 39659 | 3886 |
| <I/σ(I)> | 16.5 | 2.6 |
| Completeness [%] | 99.1 | 98.5 |
| Redundancy | 5.4 | 5.7 |
| CC(1/2) | 0.998 | 0.878 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 293 | 31% PEG550 MME, 200 mM MgCl2, 300 mM KCl and 100 mM Bis-Tris pH 6.0 |






