6WXN
EGFR(T790M/V948R) in complex with LN3844
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 24-ID-E |
Synchrotron site | APS |
Beamline | 24-ID-E |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2019-10-21 |
Detector | DECTRIS EIGER X 9M |
Wavelength(s) | 0.97918 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 71.913, 102.742, 87.306 |
Unit cell angles | 90.00, 101.20, 90.00 |
Refinement procedure
Resolution | 65.780 - 1.760 |
R-factor | 0.2093 |
Rwork | 0.208 |
R-free | 0.23550 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 6v5n |
Data reduction software | xia2 |
Data scaling software | Aimless (0.7.4) |
Phasing software | PHASER |
Refinement software | PHENIX (1.18_3845) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 85.700 | 85.700 | 1.810 |
High resolution limit [Å] | 1.760 | 7.870 | 1.760 |
Rmerge | 0.061 | 0.024 | 0.902 |
Rmeas | 0.072 | 0.028 | 1.109 |
Rpim | 0.038 | 0.015 | 0.632 |
Total number of observations | 414637 | 5158 | 21514 |
Number of reflections | 119832 | 1436 | 7355 |
<I/σ(I)> | 9 | 27.8 | 1.1 |
Completeness [%] | 97.5 | 100 | 81.7 |
Redundancy | 3.5 | 3.6 | 2.9 |
CC(1/2) | 0.998 | 0.999 | 0.482 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 5.5 | 298 | 0.1 M BisTris, 25% PEG-3350 |