6HU5
STRUCTURE OF HEWL BY ELECTRON DIFFRACTION AND MICROFOCUS DIFFRACTION
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | LaB6 THERMOIONIC SOURCE |
Temperature [K] | 100 |
Detector technology | OTHER |
Collection date | 2018-10-01 |
Detector | ASI |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 31.849, 54.380, 71.788 |
Unit cell angles | 90.00, 98.82, 90.00 |
Refinement procedure
Resolution | 42.670 - 2.800 |
R-factor | 0.2995 |
Rwork | 0.297 |
R-free | 0.33900 |
RMSD bond length | 0.004 |
RMSD bond angle | 0.776 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | XDS |
Refinement software | PHENIX ((1.13_2998)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 42.670 | 2.970 |
High resolution limit [Å] | 2.800 | 2.800 |
Rmerge | 0.655 | 0.839 |
Number of reflections | 3906 | |
<I/σ(I)> | 1.6 | 0.8 |
Completeness [%] | 66.5 | 67.1 |
Redundancy | 2.8 | 2.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | 1.5 M SODIUM CHLORIDE |