6G27
X-ray structure of NSD3-PWWP1 in complex with compound 5
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2015-03-07 |
| Detector | DECTRIS PILATUS 6M-F |
| Wavelength(s) | 1.000 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 44.466, 48.116, 63.494 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 38.350 - 1.650 |
| R-factor | 0.207 |
| Rwork | 0.206 |
| R-free | 0.22700 |
| RMSD bond length | 0.008 |
| RMSD bond angle | 0.870 |
| Data reduction software | XDS |
| Data scaling software | Aimless (0.3.11) |
| Phasing software | BALBES |
| Refinement software | BUSTER (2.11.7) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 38.350 | 1.653 |
| High resolution limit [Å] | 1.648 | 1.648 |
| Rmerge | 0.061 | 0.800 |
| Rmeas | 0.067 | 0.440 |
| Rpim | 0.026 | 0.170 |
| Number of reflections | 17031 | 5840 |
| <I/σ(I)> | 15.4 | 2.2 |
| Completeness [%] | 100.0 | 100 |
| Redundancy | 6.5 | 6.6 |
| CC(1/2) | 0.998 | 0.960 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 277 | 100mM Morpheus Buffer 3, 30% P550MME_P20K, 10% Morpheus Ethylene glycols |






