6DUN
Crystal Structure Analysis of PIN1
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 24-ID-E |
| Synchrotron site | APS |
| Beamline | 24-ID-E |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2015-10-22 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.9792 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 117.270, 36.210, 51.590 |
| Unit cell angles | 90.00, 100.75, 90.00 |
Refinement procedure
| Resolution | 50.685 - 1.590 |
| R-factor | 0.1545 |
| Rwork | 0.152 |
| R-free | 0.19870 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 1pin |
| RMSD bond length | 0.006 |
| RMSD bond angle | 0.768 |
| Data reduction software | XDS |
| Data scaling software | xia2 |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.10_2155) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 50.685 | 50.680 | 1.630 |
| High resolution limit [Å] | 1.590 | 7.110 | 1.590 |
| Rmerge | 0.081 | 0.034 | 1.025 |
| Number of reflections | 28643 | ||
| <I/σ(I)> | 8.93 | ||
| Completeness [%] | 98.9 | 97.5 | 98.7 |
| Redundancy | 3 | 2.8 | 2.7 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 298 | 2 M ammonium citrate, pH 6.5 |






