6AL8
Crystal structure HpiC1 Y101F/F138S
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 23-ID-B |
Synchrotron site | APS |
Beamline | 23-ID-B |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2017-03-07 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 1.03 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 61.990, 47.951, 174.765 |
Unit cell angles | 90.00, 97.05, 90.00 |
Refinement procedure
Resolution | 47.502 - 1.641 |
R-factor | 0.2248 |
Rwork | 0.223 |
R-free | 0.25380 |
RMSD bond length | 0.006 |
RMSD bond angle | 0.815 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Refinement software | PHENIX (1.11.1_2575) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 47.502 |
High resolution limit [Å] | 1.640 |
Number of reflections | 122677 |
<I/σ(I)> | 13.42 |
Completeness [%] | 97.7 |
Redundancy | 6.6 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 293 | 20% MEPEG 5000, 100 mM BisTris pH 6.5, 5% ethylene glycol |